NXP Semiconductors
74AHC1G32; 74AHCT1G32
2-input OR gate
PULSE
VI
GENERATOR
VCC
VO
DUT
RT
CL
mna101
Fig 6.
Test data is given in Table 8.
Definitions for test circuit:
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Load circuitry for switching times
74AHC_AHCT1G32_7
Product data sheet
Rev. 07 — 14 May 2009
© NXP B.V. 2009. All rights reserved.
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