ADG801/ADG802
Test Circuits
PRELIMINARY TECHNICAL DATA
IDS
V1
S
D
VS
RON = V1/IDS
Test Circuit 1. On Resistance
IS (OFF)
S
A
VS
ID (OFF)
D
A
VD
Test Circuit 2. Off Leakage
NC
S
ID (ON)
D
A
NC=No Connect
VD
Test Circuit 3. On Leakage
VDD
0.1µ F
VIN ADG801 50%
50%
VDD
S
VS
IN
D
VOUT
VIN ADG802 50%
50%
RL
CL
300⍀
35pF
VOUT
90%
90%
GND
tON
tOFF
Test Circuit 4. Switching Times
VDD
RS
VS
VDD
S
D
IN
GND
VOUT
CL
1nF
VIN ADG801
ON
OFF
VIN ADG802
VOUT
QINJ = CL ؋ ⌬VOUT
⌬VOUT
Test Circuit 5. Charge Injection
0.1µ F
VDD
IN
VIN
VDD
S
D
GND
50Ω
NETWORK
ANALYZER
50Ω
VS
RL VOUT
50Ω
VOUT
OFF ISOLATION = 20 LOG VS
Test Circuit 6. Off Isolation
VDD
0.1µ F
IN
VIN
VDD
S
D
GND
NETWORK
ANALYZER
50Ω
VS
RL VOUT
50Ω
INSERTION LOSS = 20 LOG VOUT WITH SWITCH
VOUT WITHOUT SWITCH
Test Circuit 7. Bandwidth
–8–
REV. PrE