FCPF20N60FS 데이터 시트보기 (PDF) - Fairchild Semiconductor
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FCPF20N60FS Datasheet PDF : 14 Pages
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Qualification Plan
Q20120260
Device
FDP22N50N
Package
TO220003
Process
UniFET2 500V
No. of Lots
3
Reliability
Test
Condition
HTGB
HTRB
HTSL
HAST
PRCL
100 % Rated VGS,
Tj max=150C
80% of Rated BV,
Tj max=150C
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 3.5
min on, 3.5 min off
RSDH
TMCL
260C
-65 C to 150 C, 30
min/ cycles
Standard
JESD22-
A108
JESD22-
A108
JESD22-
A103
JESD22-
A110
MIL-
STD-
750-
1036
JESD22-
B106
JESD22-
A104
Device
Name
Lot No.
Duration
1000hrs
1000hrs
1000hrs
96hrs
8572
cycles
10 sec
500
cycles
FDP22N50N
Q20120260AA
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
FDP22N50N
Q20120260AB
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
FDP22N50N
Q20120260AC
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
Qualification Plan
Q20120263
Device
FCP20N60
Package
TO220003
Process
Super-FET 600V TO220
No. of Lots
3
Reliability
Test
Condition
HTGB
HTRB
HTSL
HAST
PRCL
100 % Rated VGS,
Tj max=150C
80% of Rated BV,
Tj max=150C
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 3.5
min on, 3.5 min off
RSDH
TMCL
260C
-65 C to 150 C, 30
min/ cycles
Standard
JESD22-
A108
JESD22-
A108
JESD22-
A103
JESD22-
A110
MIL-
STD-
750-
1036
JESD22-
B106
JESD22-
A104
Device
Name
Lot No.
Duration
1000hrs
1000hrs
1000hrs
96hrs
8572
cycles
10 sec
500
cycles
FCP20N60
Q20120263AA
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
FCP20N60
Q20120263AB
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
FCP20N60
Q20120263AC
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
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