74LVT125DB 데이터 시트보기 (PDF) - NXP Semiconductors.
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74LVT125DB Datasheet PDF : 16 Pages
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Nexperia
74LVT125; 74LVTH125
3.3 V quad buffer; 3-state
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Fig 8.
Test data is given in Table 8.
Definitions test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = Test voltage for switching times.
Test circuit for measuring switching times
Table 8.
Input
VI
2.7 V
Test data
fi
10 MHz
tW
500 ns
tr, tf
2.5 ns
Load
CL
50 pF
RL
500
VEXT
tPHZ, tPZH
GND
tPLZ, tPZL
6V
tPLH, tPHL
open
74LVT_LVTH125
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 31 May 2016
© Nexperia B.V. 2017. All rights reserved
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