S70FL256P
12. Revision History
Document History Page
Document Title: S70FL256P, 256-Mbit 3.0V Flash
Document Number: 002-00647
Rev.
ECN No.
Orig. of Submission
Change
Date
Description of Change
**
–
BWHA 03/03/2010 Initial release
Valid Combinations:
*A
–
BWHA
03/17/2010
Corrected Package Marking specification from discrete to MCP format
Read Identification (RDID):
n Added section to explain CFI change from FL129P
ig General:
s Changed product description from “256-Mbit CMOS 3.0 Volt Flash Memory with
e 93-MHz SPI Serial (Serial Peripheral Interface) Multi I/O Bus” to “256-Mbit
D CMOS 3.0 Volt Flash Memory with 104-MHz SPI Serial (Serial Peripheral
*B
–
Not Recommended for New BWHA
06/17/2010
Interface) Multi I/O Bus”
Changed data sheet status from Advanced Information to Preliminary
Distinctive Characteristics:
Changed Normal READ clock rate from 36 to 40 MHz
Changed FAST_READ maximum clock rate from 93 to 104 MHz
Changed DUAL I/O FAST_READ clock rate from 72 to 80 MHz and effective
data rate from18 to 20 MB/s
Ordering Information:
Changed description for Speed characters 0X from 93 to 104 MHz
DC Characteristics:
Changed ILI (Input Leakage Current) value from ± 4 to ± 2 µA (max)
Changed ILO (Output Leakage Current) value from ± 4 to ± 2 µA (max)
Changed ICC1 (Active Power Supply Current - READ) test condition frequencies
from 72/93/36 MHz to 80/104/40 MHz
Changed ICC1 (Active Power Supply Current - READ) value @ 80 MHz (dual/
quad) from 41.8 to 44 mA (max)
Changed ICC1 (Active Power Supply Current - READ) value @ 104 MHz (serial)
from 27.5 to 32 mA (max)
Changed ICC1 (Active Power Supply Current - READ) value @ 40 MHz (serial)
from13.2 to 15 mA (max)
Changed ICC2 (Active Power Supply Current - Page Program) value from 28.6
to 26 mA (max)
Changed ICC3 (Active Power Supply Current - WRR) value from 16.5 to 15 mA
(max)
Changed ICC4 (Active Power Supply Current - SE) value from 28.6 to 26 mA
(max)
Changed ICC5 (Active Power Supply Current - BE) value from 28.6 to 26 mA
(max)
Added Note 2, clarifying that Bulk Erase is on a die per die basis, not for the
whole device
Test Conditions:
Added note clarifying that input rise and fall times are 0-100%
Document Number: 002-00647 Rev. *F
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