UT54ACS109 데이터 시트보기 (PDF) - Aeroflex Corporation

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UT54ACS109

Radiation-Hardened Dual J-K Flip-Flops

Aeroflex Corporation 

LOGIC DIAGRAM

UT54ACS109/UT54ACTS109

PRE

Q

CLK

J

Q

K

CLR

RADIATION HARDNESS SPECIFICATIONS 1

PARAMETER

Total Dose

SEU Threshold 2

SEL Threshold

Neutron Fluence

LIMIT

1.0E6

80

120

1.0E14

UNITS

rads(Si)

MeV-cm2/mg

MeV-cm2/mg

n/cm2

Notes:

1. Logic will not latchup during radiation exposure within the limits defined in the table.

2. Device storage elements are immune to SEU affects.

ABSOLUTE MAXIMUM RATINGS

SYMBOL

PARAMETER

LIMIT

UNITS

VDD

Supply voltage

-0.3 to 7.0

V

VI/O

Voltage any pin

-.3 to VDD +.3

V

TSTG

TJ

Storage Temperature range

Maximum junction temperature

-65 to +150

C

+175

C

TLS

Lead temperature (soldering 5 seconds)

+300

C

JC

Thermal resistance junction to case

20

C/W

II

DC input current

10

mA

PD

Maximum power dissipation

1

W

Note:

1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device

at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for

extended periods may affect device reliability.

RadHard MSI Logic

62

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