74AC00 데이터 시트보기 (PDF) - STMicroelectronics

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74AC00

QUAD 2-INPUT NAND GATE

STMicroelectronics 

74AC00

CAPACITIVE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

VCC

(V)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance 5.0

4

pF

CPD Power Dissipation 5.0

Capacitance

fIN = 10MHz

31

pF

(note 1)

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate)

TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = R1 = 500Ω or equivalent

RT = ZOUT of pulse generator (typically 50Ω)

WAVEFORM: PROPAGATION DELAYS (f=1MHz; 50% duty cycle)

4/8

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