MAL219836221E3 데이터 시트보기 (PDF) - Vishay Semiconductors
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MAL219836221E3
Vishay Semiconductors
MAL219836221E3 Datasheet PDF : 8 Pages
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198 PHR-SI
Vishay BCcomponents
Table 5
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
REQUIREMENTS
Endurance
Useful life
Shelf life
(storage at
high temperature)
IEC 60384-4 /
EN 130300
subclause 4.13
CECC 30301
subclause 1.8.1
IEC 60384-4 /
EN 130300
subclause 4.17
Tamb = 85 C; UR applied;
7000 h
Tamb = 85 C; UR and IR applied;
15 000 h
Tamb = 85 C; no voltage applied;
1000 h
After test: UR to be applied for 30 min,
24 h to 48 h before measurement
C/C: ± 10 %
ESR 2 x spec. limit
IL5 spec. limit
C/C: ± 30 %
ESR 3 x spec. limit
IL5 spec. limit
C/C: ±15 %
ESR 2 x spec. limit
IL5 2 x spec. limit
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
Revision: 17-Oct-16
7
Document Number: 28339
For technical questions, contact: aluminumcaps2@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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