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T491S107M035AT

Surface Mount Capacitors

KEMET 

SOLID TANTALUM CHIP CAPACITORS

TANTALUM MnO2 COMPONENT PERFORMANCE CHARACTERISTICS (con’t.)

Mounted capacitors withstand extreme temperature

testing at a succession of continuous steps at

+25°C, -55°C, +25°C, +85°C, +125°C, +25°C, in the

order stated. Capacitors shall be brought to thermal

stability at each test temperature. Capacitance, DF

and DCL are measured at each test temperature

except that DCL is not measured at -55°C. DC bias

of 2.0± 0.5 is recommended for the capacitance

and D F requirements.

14. Thermal Shock

• Mil-Std-202, Method 107, Condition B

Minimum temperature -55°C, mounted

Post Test Performance:

a. Capacitance — within ±5% of initial value

b. DC Leakage — within initial limit

c. Dissipation Factor — within initial limit

d. ESR — within initial limit

15. Moisture Resistance

• Mil-Std-202, Method 106

Steps 7a and 7b excluded, rated voltage,

42 cycles, mounted

Post Test Performance:

a. Capacitance — within ±10% of initial value

b. DC Leakage — within initial limit

c. Dissipation Factor — within initial limit

d. ESR — within initial limit

• JEDEC J-STD-20C — meets MSL1 for Pb-free

assembly

16. Electrostatic Discharge (ESD)

• Human Body Model

2,000 ±50 volts, 1,500 ±5% ohms, 40 nano-

second pulse each polarity, 1 pulse each

polarity, 5 seconds between pulses, +25ЊC.

• Charged Device Model

200 ± 5 volts, 0 ohms, 40 nanosecond

pulse, each polarity, 9 pulses each polarity,

5 seconds between pulses, +25ЊC.

Product subjected to above test condition

demonstrate no sensitivity to electrostatic

discharge.

17. Long Term Stability

Within the general class of electrolytic capacitors,

solid tantalum capacitors offer unusual stability of

the three important parameters: capacitance, dis-

sipation factor and leakage current. These solid-

state devices are not subject to the effects of

electrolysis, deforming or drying-out associated

with liquid-electrolyte capacitors.

When stabilized for measurement at standard

conditions, capacitance will typically change less

than ±3% during a 10,000 hour life test +85°C.

The same comparative change has been

observed in shelf tests at +25°C extending for

50,000 hours. (Some of this change may stem

from instrument or fixture error.)

Dissipation factor exhibits no typical trend. Data

from 10,000 hour life test at +85°C show that ini-

tial limits (at standard conditions) are not exceeded

at the conclusion of these tests.

Leakage current is more variable than capaci-

tance or DF; in fact, leakage current typically

exhibits a logarithmic dependence in several

respects. Military Specifications permit leakage

current (measured at standard conditions) to rise

by a factor of four over 10,000 hour life tests.

Typical behavior shows a lower rate of change,

which may be negative or positive. Initial leakage

currents are frequently so low (less than 0.1

nanoampere in the smallest CV capacitors) that

changes of several orders of magnitude have no

discernable effect on the usual circuit designs.

18. Failure Mode

Capacitor failure may be induced by exceeding

50% of rated voltage of the capacitor with forward

DC voltage, reverse DC voltage, power dissipation,

or temperature. As with any practical device, these

capacitors also possess an inherent, although low,

failure rate when operated at less than 50% of the

rated voltage of the capacitor.

The dominant failure mode is by short-circuit.

Minor parametric drifts are of no consequence in

circuits suitable for solid tantalum capacitors.

Catastrophic failure occurs as an avalanche in DC

leakage current over a short (millisecond) time

span. The failed capacitor, while called “short-cir-

cuited”, may exhibit a DC resistance of 10 to 104

ohm.

If a failed capacitor is in an unprotected low-

impedance circuit, continued flow of current

through the capacitor may obviously produce

severe overheating. The over-heated capacitor

may damage the circuit board or nearby compo-

nents. Protection against such occurrence is

obtained by current-limiting devices or fuses pro-

vided by the circuit design. KEMET’s T496 series

offers a built-in fuse to convert the normal short

circuit failure mode to an open circuit.

Fortunately, the inherent failure rate of KEMET

solid tantalum capacitors is low, and this failure

rate may be further improved by circuit design.

Statistical failure rates are provided for military

capacitors. Relating circuit conditions to failure

rate is aided by the guides in the section following.

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©KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300

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