DAC10G 데이터 시트보기 (PDF) - Analog Devices

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DAC10G

10-Bit High Speed Multiplying D/A Converter (Universal Digital Logic Interface)

Analog Devices 

DAC10

WAFER TEST LIMITS (@ VS = ؎15 V, IREF = 2 mA, TA = +25؇C, unless otherwise noted. Output characteristics refer to both

IOUT and IOUT).

Parameter

Symbol

Conditions

DAC10N

Limit

Units

RESOLUTION

10

Bits min

MONOTONICITY

10

Bits min

NONLINEARITY

NL

± 0.5

LSB max

OUTPUT VOLTAGE COMPLIANCE

VOC

True 1 LSB

+10

–5

V max

V min

OUTPUT CURRENT RANGE

ZERO-SCALE CURRENT

IZS

LOGIC INPUT “1”

VIH

LOGIC INPUT “0”

VIL

POSITIVE SUPPLY CURRENT

I+

IFS ± 3.996 mA

± 18

All Bits OFF

0.5

IIN = 100 nA

2

VLC @ Ground

0.8

IIN = –100 µA

V+ = 15 V

4

µA max

µA max

V min

V max

mA max

NEGATIVE SUPPLY CURRENT

I–

V+ = –15 V

–15

mA max

NOTE: Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not

guaranteed for standard produce dice.

TYPICAL ELECTRICAL CHARACTERISTICS (@ VS = ؎15 V, IREF = 2 mA, unless otherwise noted. Output characteristics

refer to both IOUT and IOUT).

Parameter

Symbol Conditions

DAC10F

Typ

Units

SETTLING TIME

tS

GAIN TEMPERATURE

COEFFICIENT (TC)

OUTPUT CAPACITANCE

To ± 1/2 LSB When Output Is Switched from 0 to FS 85

VREF Tempco Excluded

± 10

18

ns

ppm FS/°C

pF

OUTPUT RESISTANCE

10

MΩ

DICE CHARACTERISTICS

REV. D

DIE SIZE 0.091 ؋ 0.087 inch, 7,917 sq. mils

(2.311 ؋ 2.210 mm, 5.107 sq. mm)

–3–

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