DS1000Z 데이터 시트보기 (PDF) - Dallas Semiconductor -> Maxim Integrated

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DS1000Z

5-Tap Silicon Delay Line

Dallas Semiconductor -> Maxim Integrated 

TEST CONDITIONS

DS1000

INPUT:

Ambient Temperature:

Supply Voltage (VCC):

Input Pulse:

Source Impedance:

Rise and Fall Time:

Pulse Width:

Period:

25°C ±=3°C

5.0V ±=0.1V

High = 3.0V ±=0.1V

Low = 0.0V ±=0.1V

50 ohm Max.

3.0 ns Max. (measured between 0.6V and 2.4V)

500 ns (1 µs for -500)

1 µs (2 µs for -500)

OUTPUT:

Each output is loaded with the equivalent of one 74F04 input gate. Delay is measured at the 1.5V level on

the rising and falling edge.

NOTE:

Above conditions are for test only and do not restrict the operation of the device under other data sheet

conditions.

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