EVAL-ADE7768EB 데이터 시트보기 (PDF) - Analog Devices

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EVAL-ADE7768EB

Energy Metering IC with Integrated Oscillator and Positive Power Accumulation

Analog Devices 

ADE7768

Parameter

Value Unit

Test Conditions/Comments

POWER SUPPLY

For specified performance

VDD

4.75

V min

5 V – 5%

5.25

V max

5 V + 5%

IDD

5

mA max

Typically 4 mA

1 See the Terminology section for an explanation of specifications.

2 See the figures in the Typical Performance Characteristics section.

3 Sample tested during initial release and after any redesign or process change that may affect this parameter.

TIMING CHARACTERISTICS

VDD = 5 V ± 5%, AGND = DGND = 0 V, on-chip reference, RCLKIN = 6.2 kΩ, 0.5% ± 50 ppm/°C, TMIN to TMAX = –40°C to +85°C,

unless otherwise noted. Sample tested during initial release and after any redesign or process change that may affect this parameter.

See Figure 2.

Table 2.

Parameter

Specifications

Unit

Test Conditions/Comments

t1 1

120

ms

F1 and F2 pulse width (logic low)

t2

See Table 6

sec

Output pulse period. See the Transfer Function section.

t3

1/2 t2

sec

Time between the F1 and F2 falling edges.

t41, 2

90

ms

CF pulse width (logic high).

t5

See Table 7

sec

CF pulse period. See the Transfer Function section.

t6

2

μs

Minimum time between the F1 and F2 pulses.

1 The pulse widths of F1, F2, and CF are not fixed for higher output frequencies. See the Frequency Outputs section.

2 The CF pulse is always 35 μs in high frequency mode. See the Frequency Outputs section and Table 7.

t1

F1

t6

t2

F2

t3

t4

t5

CF

Figure 2. Timing Diagram for Frequency Outputs

Rev. A | Page 4 of 20

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