AD5162 데이터 시트보기 (PDF) - Analog Devices

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AD5162

Dual, 256-Position, SPI Digital Potentiometer

Analog Devices 

AD5162

TEST CIRCUITS

Figure 27 through Figure 32 illustrate the test circuits that define the test conditions used in the product specification tables (see Table 1

and Table 2).

DUT

A

W

V+

B

V+ = VDD

1LSB = V+/2N

VMS

VA

DUT

V+ ∆VDD A W

B

V+ = VDD ± 10%

( ) PSRR (dB) = 20 LOG

PSS

(%/%)

=

∆VMS%

∆VDD%

∆VMS

∆VDD

VMS

Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error

(INL, DNL)

Figure 30. Test Circuit for Power Supply Sensitivity

(PSS, PSSR)

NO CONNECT

DUT

AW

B

IW

VMS

Figure 28. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation: R-INL, R-DNL)

VMS2

DUT

A

W

B

IW = VDD/RNOMINAL

VW

RW = [VMS1 – VMS2]/IW

VMS1

Figure 29. Test Circuit for Wiper Resistance

VIN

OFFSET

GND

2.5V

DUT

AW

B

+15V

AD8610

–15V

VOUT

Figure 31. Test Circuit for Gain vs. Frequency

NC

DUT

VDD

A

ICM

W

GND B

VCM

NC NC = NO CONNECT

Figure 32. Test Circuit for Common-Mode Leakage Current

Rev. C | Page 12 of 20

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