N74F322N 데이터 시트보기 (PDF) - Philips Electronics
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N74F322N Datasheet PDF : 10 Pages
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Philips Semiconductors
8-bit serial/parallel register with sign extend (3-State)
Product specification
74F322
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH
High-level output voltage
Q7
I/On
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH = –1mA
IOH = –3mA
±10%VCC
±5%VCC
±10%VCC
2.5
2.7
2.4
3.4
V
V
V
±5%VCC
2.7
3.3
V
VOL
Low-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
IOL = MAX
±10%VCC
±5%VCC
0.38 0.55
V
0.35 0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at
others
maximum input voltage
I/On
VCC = MAX, VI = 7.0V
VCC = MAX, VI = 5.5V
100
µA
1
mA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
SE
–1.8
mA
IIL
Low-level input current
S
others
VCC = MAX, VI = 0.5V
–1.2
mA
–0.6
mA
IIH + IOZH
Off-state output current
High-level voltage applied
VCC = MAX, VI = 2.7V
70
µA
IIL + IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICCH
50
75
mA
ICC
Supply current (total)
ICCL
VCC = MAX
60
90
mA
ICCZ
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1988 Apr 22
5
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