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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

74ACTQ541 데이터 시트보기 (PDF) - Fairchild Semiconductor

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74ACTQ541 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
DC Electrical Characteristics
Symbol
Parameter
VIH Minimum HIGH Level
Input Voltage
VIL Maximum LOW Level
Input Voltage
VOH Minimum HIGH Level
Output Voltage
VOL Maximum LOW Level
Output Voltage
IIN
IOZ
ICCT
IOLD
IOHD
ICC
VOLP
VOLV
VIHD
VILD
Maximum Input
Leakage Current
Maximum 3-STATE
Leakage Current
Maximum ICC/Input
Minimum Dynamic
Output Current(2)
Maximum Quiescent
Supply Current
Quiet Output Maximum
Dynamic VOL
Quiet Output Minimum
Dynamic VOL
Minimum HIGH Level
Dynamic Input Voltage
Maximum LOW Level
Dynamic Input Voltage
VCC (V)
4.5
5.5
Conditions
VOUT = 0.1V
or VCC – 0.1V
4.5 VOUT = 0.1V
5.5 or VCC – 0.1V
3.0 IOUT = –50µA
4.5
4.5 VIN = VIL or VIH,
5.5 IOH = –24mA(1)
3.0 IOUT = 50µA
4.5
4.5 VIN = VIL or VIH,
5.5 IOH = 24mA(1)
5.5 VI = VCC, GND
TA = +25°C TA = –40°C to +85°C
Typ.
Guaranteed Limits Units
1.5 2.0
2.0
V
1.5 2.0
2.0
1.5 0.8
0.8
V
1.5 0.8
0.8
2.99 2.9
2.9
V
4.49 4.4
4.4
3.86
3.76
4.86
4.76
0.002 0.1
0.1
V
0.001 0.1
0.1
0.36
0.44
0.36
0.44
±0.1
±1.0
µA
5.5 VI = VIL, VIH;
VO = VCC, GND
±0.25
±2.5
µA
5.5 VI = VCC – 2.1V
0.6
1.5
mA
5.5 VOLD = 1.65V Max.
75
mA
5.5 VOHD = 3.85V Min.
–75
mA
5.5 VIN = VCC or GND
4.0
40.0
µA
5.0 Figures 1 & 2(3)
1.1 1.5
V
5.0 Figures 1 & 2(3)
–0.6 –1.2
V
5.0 (4)
1.9 2.2
V
5.0 (4)
1.2 0.8
V
Notes:
1. All outputs loaded; thresholds on input associated with output under test.
2. Maximum test duration 2.0ms, one output loaded at a time.
3. Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND.
4. Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 5V (ACQ). Input-under-test switching:
5V to threshold (VILD), 0V to threshold (VIHD), f = 1MHz.
©1993 Fairchild Semiconductor Corporation
74ACTQ541 Rev. 1.6.0
4
www.fairchildsemi.com

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