74AHC273_08 데이터 시트보기 (PDF) - NXP Semiconductors.

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74AHC273_08

Octal D-type flip-flop with reset; positive-edge trigger

NXP Semiconductors. 

NXP Semiconductors

74AHC273; 74AHCT273

Octal D-type flip-flop with reset; positive-edge trigger

VI 90 %

tW

negative

pulse

VM

GND

10 %

tf

tr

VI

90 %

positive

pulse

VM

10 %

GND

tW

VCC

VI

G

DUT

RT

VM

tr

tf

VM

VO

CL

001aah768

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Fig 10. Load circuitry for measuring switching times

Table 9. Test data

Type

74AHC273

74AHCT273

Input

VI

VCC

3.0 V

tr, tf

≤ 3.0 ns

≤ 3.0 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

Test

tPLH, tPHL

tPLH, tPHL

74AHC_AHCT273_3

Product data sheet

Rev. 03 — 13 May 2008

© NXP B.V. 2008. All rights reserved.

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