HEF4528BP 데이터 시트보기 (PDF) - NXP Semiconductors.
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HEF4528BP Datasheet PDF : 16 Pages
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NXP Semiconductors
HEF4528B
Dual monostable multivibrator
VI
nCD input
VM
0V
tW
trec
tW
VI
nA input
VM
0V
tsu
tW
VI
nB input
VM
0V
tsu
VOH
nQ output
VOL
tW
VM
001aae731
Fig 6.
Measurement points are given in Table 9.
Set-up and recovery times are shown as positive values but may be specified as negative values.
Logic levels: VOL and VOH are typical output levels that occur with the output load.
Waveforms showing minimum nA, nB, and nQ pulse widths and set-up and recovery times
VDD
VI
G
VO
DUT
RT
CL
001aag182
Fig 7.
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test.
CL = load capacitance including jig and probe capacitance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Test circuit for measuring switching times
Table 10. Test data
Supply voltage
VDD
5 V to 15 V
Input
VI
VSS or VDD
tr, tf
≤ 20 ns
Load
CL
50 pF
HEF4528B_6
Product data sheet
Rev. 06 — 27 November 2009
© NXP B.V. 2009. All rights reserved.
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