74HC4052DB 데이터 시트보기 (PDF) - NXP Semiconductors.
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74HC4052DB Datasheet PDF : 29 Pages
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NXP Semiconductors
74HC4052; 74HCT4052
Dual 4-channel analog multiplexer/demultiplexer
VCC
Sn
Vis
10 μF nYn/nZ
nZ/nYn
Vos
VEE GND RL
CL dB
Fig 16. Test circuit for measuring sine-wave distortion
001aah829
VCC
Sn
Vis
0.1 μF nYn/nZ
nZ/nYn
Vos
VEE GND RL
CL dB
VCC = 4.5 V; GND = 0 V; VEE = 4.5 V; RL = 600 ; RS = 1 k.
a. Test circuit
001aah871
0
αiso
(dB)
−20
001aae332
−40
−60
−80
−100
10
102
103
104
b. Isolation (OFF-state) as a function of frequency
Fig 17. Test circuit for measuring isolation (OFF-state)
105
106
fi (kHz)
74HC_HCT4052
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 10 — 19 July 2012
© NXP B.V. 2012. All rights reserved.
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