SPT5420SIM 데이터 시트보기 (PDF) - Signal Processing Technologies
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SPT5420SIM Datasheet PDF : 7 Pages
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ELECTRICAL SPECIFICATIONS
TA = TMIN to TMAX, VCC = +5.0 V, VDD = +11.5 V, VSS = –8.0 V, VREFT=3.5 V, VREFB=–1.5 V, RL = +10 kΩ, CL = 50 pF, unless otherwise specified.
TEST
TEST
SPT5420
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX UNITS
Power Requirements
VCC Supply Voltage (Digital)
VI
VCC Supply Voltage (Digital)
V
VDD Supply Voltage (Analog)1,2
VI
VSS Supply Voltage (Analog)1,2
VI
ICC Supply Current
IDD Supply Current
Outputs Unloaded
ISS Supply Current
Outputs Unloaded
Dynamic Performance
Output Settling Time
(Full Scale Change to ±0.5 LSB) +Full Scale to –Full Scale IV
Slew Rate
V
Glitch Impulse
V
Channel to Channel Isolation
V
DAC to DAC Crosstalk
V
Digital Crosstalk
V
Digital Feedthrough
V
4.75
5
–12.5
5
11.5
–8
5
5
20
2.0
35
100
40
5
5
V
5.25
V
12.5
V
–5
V
0.5
mA
10
mA
10
mA
µs
V/µs
nV-s
dB
nV-s
nV-s
nV-s
Notes:
1. Supplies should provide 2.5 V headroom above and below max output swing.
2. VDD – VSS ≤ 20 V
DEFINITION OF SELECTED TERMINOLOGY
Channel-to-Channel Isolation
Channel-to-Channel isolation refers to the proportion of input signal from one DAC’s reference input that appears at the output of the other
DAC. It is expressed in dBs.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is defined as the glitch impulse that appears at one DAC’s output due to both the digital change and subsequent
analog output change at any other DAC. It is specified in nV-s.
Digital Crosstalk
The glitch impulse transferred to one DAC’s output due to a change in digital input code of any other DAC. It is specified in nV-s.
Digital Feedthrough
Digital feedthrough is the noise at a DAC’s output caused by changes to D0–D12 while WR is high.
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
III
cates the specific device testing actually per-
formed during production and Quality Assur-
IV
ance inspection. Any blank section in the data
column indicates that the specification is not
V
tested at the specified condition.
Unless otherwise noted, all tests are pulsed
VI
tests; therefore, TJ = TC = TA.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
SPT
3
SPT5420
10/11/00
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