MC100E107FN 데이터 시트보기 (PDF) - ON Semiconductor
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MC100E107FN Datasheet PDF : 8 Pages
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MC10E107, MC100E107
Table 8. AC CHARACTERISTICS VCCx= 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 9)
−40°C
25°C
Symbol
fMAX
tPLH
tPHL
Characteristic
Maximum Toggle Frequency
Propagation Delay to Output
Min Typ Max Min Typ Max Min
700
700
D to Q 250
D to F 500
410 600 250
725 1000 500
410 600 250
725 1000 500
tSKEW Within-Device Skew (Note 10)
D to Q
75
75
tJITTER
tr
tf
Random Clock Jitter (RMS)
Rise/Fall Time
(20 - 80%)
<1
<1
Q 275 450 700 275 450 700 275
F 300 475 700 300 475 700 300
85°C
Typ
700
410
725
75
<1
450
475
Max
600
1000
Unit
MHz
ps
ps
ps
ps
700
700
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
10. Within-device skew is defined as identical transitions on similar paths through a device.
Q
Driver
Device
Q
Zo = 50 W
Zo = 50 W
50 W
50 W
D
Receiver
Device
D
VTT
VTT = VCC − 2.0 V
Figure 3. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
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