
Spansion Inc.
Distinctive Characteristics
◾ Single 1.8V read, program and erase (1.70V to 1.95V)
◾ VersatileIO™ Feature
– Device generates data output voltages and tolerates data input
voltages as determined by the voltage on the VCCQ pin
– 1.8V compatible I/O signals
◾ Multiplexed Data and Address for reduced I/O count
– A15–A0 multiplexed as DQ15–DQ0
– Addresses are latched by AVD# control input when CE# low
◾ Simultaneous Read/Write operation
– Data can be continuously read from one bank while executing
erase/program functions in other bank
– Zero latency between read and write operations
◾ Read access times at 66 MHz
– Burst access times of 9/11 ns at industrial temperature range
– Asynchronous random access times of 80 ns
– Synchronous random access times of 80 ns
◾ Burst length
– Continuous linear burst
– 8/16/32 word linear burst with wrap around
– 8/16/32 word linear burst without wrap around
◾ Secured Silicon Sector region
– 256 words accessible through a command sequence
– 128 words for the Factory Secured Silicon Sector
– 128 words for the Customer Secured Silicon Sector
◾ Power dissipation (typical values: 8 bits switching,
CL = 30 pF) @ 66 MHz
– Continuous Burst Mode Read: 28 mA
– Simultaneous Operation: 50 mA
– Program/Erase: 19 mA
– Standby mode: 20 µA
◾ Sector Architecture
– Four 16 K word sectors (S29NS256N and S29NS128N) and four 8K
word sectors (S29NS064N) in upper-most address range
– Two-hundred-fifty-five 64-Kword sectors (S29NS256N),
one-hundred-twenty-seven 64-Kword sectors (S29NS128N) and one
hundred twenty-seven 32Kword sectors (S29NS064N)
– Sixteen banks (S29NS128N and S29NS256N) and eight banks
(S29NS064N)
◾ High Performance
– Typical word programming time of 40 µs
– Typical effective word programming time of 9.4 µs utilizing a
32-Word Write Buffer at VCC Level
– Typical effective word programming time of 6 µs utilizing a 32-Word
Write Buffer at ACC Level
– Typical sector erase time of 150 ms for 16 Kword sectors and
800 ms sector erase time for 64 Kword sectors