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74LVC1G74DC-Q100 データシート - NXP Semiconductors.

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部品番号
74LVC1G74DC-Q100

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NXP Semiconductors. 

General description
The 74LVC1G74-Q100 is a single positive edge triggered D-type flip-flop. It has individual data (D) inputs, clock (CP) inputs, set (SD) and reset (RD) inputs, and complementary QandQoutputs.
This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the output, preventing damaging backflow current through the device when it is powered down.
The set and reset are asynchronous active LOW inputs and operate independently of the clock input. Information on the data input is transferred to the Q output on the LOW-to-HIGH transition of the clock pulse. The D inputs must be stable one set-up time prior to the LOW-to-HIGH clock transition for predictable operation. Schmitt trigger action at all inputs makes the circuit highly tolerant of slower input rise and fall times.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.


FEATUREs and benefits
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from -40℃ to +85℃ and from -40℃ to +125℃
Wide supply voltage range from 1.65 V to 5.5 V
5 V tolerant inputs for interfacing with 5 V logic
High noise immunity
Complies with JEDEC standard:
JESD8-7 (1.65 V to 1.95 V)
JESD8-5 (2.3 V to 2.7 V)
JESD8-B/JESD36 (2.7 V to 3.6 V)
ESD protection:
MIL-STD-883, method 3015 exceeds 2000 V
HBM JESD22-A114F exceeds 2000 V
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )
 ±24 mA output drive (VCC=3.0V)
CMOS low power consumption
Latch-up performance exceeds 250 mA
Direct interface with TTL levels
Inputs accept voltages up to 5 V
Multiple package options

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