AD7845
TIMING CHARACTERISTICS1 (VDD = +15 V, ؎ 5%. VSS = –15 V, ؎ 5%. VREF = +10 V. AGND = DGND = O V.)
Parameter
Limit at TMIN to TMAX
(All Versions)
tCS
30
tCH
0
tWR
30
tDS
80
tDH
0
NOTES
1Guaranteed by design and characterization, not production tested.
Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS1
(TA = +25°C unless otherwise stated)
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . .–0.3 V to +17 V
VSS to DGND . . . . . . . . . . . . . . . . . . . . . . . .+0.3 V to –17 V
VREF to AGND . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
VRFB to AGND . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
VRA to AGND . . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
VRB to AGND . . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
VRC to AGND . . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
VOUT to AGND2 . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, VDD
Digital Input Voltage to DGND . . . . . –0.3 V to VDD + 0.3 V
Power Dissipation (Any Package)
To +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 650 mW
Derates above +75°C . . . . . . . . . . . . . . . . . . . . . 10 mW/°C
Units
ns min
ns min
ns min
ns min
ns min
Test Conditions/Comments
Chip Select to Write Setup Time
Chip Select to Write Hold Time
Write Pulsewidth
Data Setup Time
Data Hold Time
Operating Temperature Range
Commercial (J, K Versions) . . . . . . . . . . . . . 0°C to +70°C
Industrial (A, B Versions) . . . . . . . . . . . . –40°C to +85°C
Extended (S, T Versions) . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . +300°C
NOTES
1Stresses above those listed under Absolute Maximum Ratings may cause
permanent damage to the device. This is a stress rating only; functional
operation of the device at these or any other conditions above those indicated in
the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of time may affect device
reliability. Only one Absolute Maximum Rating may be applied at any one time.
2VOUT may be shorted to AGND provided that the power dissipation of the
package is not exceeded.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7845 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ORDERING GUIDE1
Model2
Temperature
Range
Relative
Accuracy Package
@ +25؇C Option3
AD7845JN
AD7845KN
AD7845JP
AD7845KP
AD7845JR
AD7845KR
AD7845AQ
AD7845BQ
AD7845AR
AD7845BR
AD7845SQ/883B
AD7845TQ/883B
AD7845SE/883B
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
–55°C to +125°C
–55°C to +125°C
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
N-24
N-24
P-28A
P-28A
R-24
R-24
Q-24
Q-24
R-24
R-24
Q-24
Q-24
E-28A
NOTES
1Analog Devices reserves the right to ship either ceramic (D-24A) or cerdip
(Q-24) hermetic packages.
2To order MIL-STD-883, Class B processed parts, add /883B to part number.
3E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip
Carrier; Q = Cerdip; R = SOIC.
tCS
tCH
5V
CS
0V
tWR
5V
WR
0V
tDS
tDH
5V
DATA
0V
NOTES
1. ALL INPUT SIGNAL RISE AND FALL TIMES MEASURED FROM
2.
10% TO 90% OF +5V. tR = tF = 20ns.
TIMING MEASUREMENT REFERENCE
LEVEL
IS
VIH
+
2
VIL
Figure 1. AD7845 Timing Diagram
REV. B
–3–