A25L16PUN-F データシートの表示（PDF） - AMIC Technology

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A25L16PUN-F

16 Mbit, Low Voltage, Serial Flash Memory With 85MHz SPI Bus Interface

AMIC Technology 

A25L16P Series

Absolute Maximum Ratings*

Storage Temperature (TSTG) . . . . . . . . . . . . -65°C to + 150°C

Lead Temperature during Soldering (Note 1)

D.C. Voltage on Any Pin to Ground Potential . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.6V to VCC+0.6V

Transient Voltage (<20ns) on Any Pin to Ground Potential . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -2.0V to VCC+2.0V

Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . -0.6V to +4.0V

Electrostatic Discharge Voltage (Human Body model) (VESD)

(Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . -2000V to 2000V

*Comments

Stressing the device above the rating listed in the Absolute

Maximum Ratings" table may cause permanent damage to the

device. These are stress ratings only and operation of the

device at these or any other conditions above those indicated

in the Operating sections of this specification is not implied.

Exposure to Absolute Maximum Rating conditions for

extended periods may affect device reliability. Refer also to

the AMIC SURE Program and other relevant quality docu-

ments.

Notes:

1. Compliant with JEDEC Std J-STD-020B (for small body,

Sn-Pb or Pb assembly).

2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 Ω ,

R2=500Ω)

DC AND AC PARAMETERS

This section summarizes the operating and measurement

conditions, and the DC and AC characteristics of the device.

The parameters in the DC and AC Characteristic tables that

follow are derived from tests performed under the

Measurement Conditions summarized in the relevant tables.

Designers should check that the operating conditions in their

circuit match the measurement conditions when relying on

the quoted parameters.

Table 7. Operating Conditions

Symbol

Parameter

VCC

Supply Voltage

TA

Ambient Operating Temperature

Min.

Max.

Unit

2.7

3.6

V

–40

85

°C

Table 8. Data Retention and Endurance

Parameter

Condition

Min.

Erase/Program Cycles At 85°C

Data Retention

At 85°C

Note: 1. This is preliminary data

Table 9. Capacitance

Symbol

Parameter

Test Condition

COUT

Output Capacitance (DO)

VOUT = 0V

CIN

Input Capacitance (other pins)

VIN = 0V

Note: Sampled only, not 100% tested, at TA=25°C and a frequency of 33 MHz.

Max.

100,000

20

Unit

Cycles per sector

Years

Min.

Max.

Unit

8

pF

6

pF

PRELIMINARY (April, 2007, Version 0.6)

27

AMIC Technology Corp.

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