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CF5010BN1-1 データシートの表示(PDF) - Nippon Precision Circuits

部品番号
コンポーネント説明
メーカー
CF5010BN1-1
NPC
Nippon Precision Circuits  
CF5010BN1-1 Datasheet PDF : 25 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
SM5010 series
5010FH× series
5V operation: VDD = 4.5 to 5.5V, VSS = 0V
30 f 50MHz: Ta = 20 to +80°C, 50 < f 60MHz: Ta = 15 to +75°C unless otherwise noted.
Parameter
Symbol
Condition
Rating
Unit
min
typ
max
HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 4.5V, IOH = 4mA
3.9
4.2
V
LOW-level output voltage
VOL Q: Measurement cct 2, VDD = 4.5V, IOL = 4mA
0.3
0.5
V
HIGH-level input voltage
VIH INHN
2.0
V
LOW-level input voltage
VIL INHN
0.8
V
Output leakage current
IZ
Q: Measurement cct 2, INHN = LOW,
VDD = 5.5V
VOH = VDD
VOL = VSS
10
µA
10
5010FHA, FHC
f = 40MHz
13
26
Current consumption
IDD
Measurement cct 3, load cct 1,
INHN = open, CL = 15pF
5010FHD
f = 50MHz
5010FHE
f = 60MHz
15
30
mA
17
34
INHN pull-up resistance
RUP Measurement cct 4
5010FHA
40
100
250
k
3.57
4.2
4.83
Feedback resistance
Rf Measurement cct 5
5010FHC
5010FHD
2.63
3.1
3.57
k
1.87
2.2
2.53
5010FHE
1.87
2.2
2.53
5010FHA
11.7
13
14.3
5010FHC
9.9
11
12.1
CG
5010FHD
11.7
13
14.3
Built-in capacitance
Design value. A monitor pattern on a 5010FHE
wafer is tested.
5010FHA
7.2
8
8.8
pF
13.5
15
16.5
5010FHC
15.3
17
18.7
CD
5010FHD
15.3
17
18.7
5010FHE
13.5
15
16.5
5010HN×, HK× series
5V operation: VDD = 4.5 to 5.5V, VSS = 0V, Ta = 40 to +85°C unless otherwise noted.
Parameter
Symbol
Condition
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
Output leakage current
Current consumption
INHN pull-up resistance
Feedback resistance
Built-in capacitance
VOH Q: Measurement cct 1, VDD = 4.5V, IOH = 16mA
VOL Q: Measurement cct 2, VDD = 4.5V, IOL = 16mA
VIH INHN
VIL INHN
IZ
Q: Measurement cct 2, INHN = LOW,
VDD = 5.5V
VOH = VDD
VOL = VSS
IDD1
Measurement cct 3, load cct 2,
INHN = open, CL = 15pF, f = 50MHz
5010HK1
IDD2
Measurement cct 3, load cct 1,
INHN = open, CL = 50pF, f = 50MHz
5010HN1
RUP Measurement cct 4
Rf Measurement cct 5
CG Design value. A monitor pattern on a wafer is tested.
CD
Rating
Unit
min
typ
max
3.9
4.2
V
0.3
0.4
V
2.0
V
0.8
V
10
µA
10
20
40
mA
25
50
40
100
250
k
80
200
500
k
11.7
13
14.3
pF
15.3
17
18.7
SEIKO NPC CORPORATION —14

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