NC7SZ34 データシートの表示（PDF） - ON Semiconductor
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NC7SZ34 Datasheet PDF : 10 Pages
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC or IGND
TSTG
TJ
TL
PD
ESD
Parameter
Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Current
VIN < -0.5V
VOUT < -0.5V
DC VCC or Ground Current
Storage Temperature Range
Junction Temperature Under Bias
Junction Lead Temperature (Soldering, 10 Seconds)
Power Dissipation at +85°C
Human Body Model, JEDEC:JESD22-A114
Charge Device Model, JEDEC:JESD22-C101
Min.
-0.5
-0.5
-0.5
-65
Max.
7.0
7.0
7.0
-50
-50
±50
±50
+150
+150
+260
200
4000
2000
Unit
V
V
V
mA
mA
mA
mA
°C
°C
°C
mW
V
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
Conditions
VCC
VIN
VOUT
TA
tr, tf
Supply Voltage Operating
Supply Voltage Data Retention
Input Voltage
Output Voltage
Operating Temperature
Input Rise and Fall Times
VCC at 1.8V, 2.5V ±0.2V
VCC at 3.3V ±0.3V
VCC at 5.0V ±0.5V
JA
Thermal Resistance
Note:
1. Unused inputs must be held HIGH or LOW. They may not float.
Min.
1.65
1.5
0
0
-40
0
0
0
Max.
5.50
5.5
5.5
VCC
+85
20
10
5
80
Unit
V
V
V
°C
ns/V
°C/W
© 2010 Fairchild Semiconductor Corporation
NC7SZ34 • Rev. 1.0.1
3
www.fairchildsemi.com
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