GS9035ACPJE3 データシートの表示（PDF） - Gennum -> Semtech
部品番号
コンポーネント説明
メーカー
GS9035ACPJE3 Datasheet PDF : 14 Pages
| |||
AC ELECTRICAL CHARACTERISTICS
VCC = 5.0V, VEE = 0V, TA = 0° – 70°C unless otherwise stated, RLF = 1.8K, CLF1 = 15nF, CLF2 = 3.3pF
PARAMETER
CONDITION
MIN TYPICAL1
MAX
UNITS
NOTES
TEST
LEVEL
Serial Data Rate
SDI
143
-
540
Mb/s
3
Intrinsic Jitter
270Mb/s
Psuedorandom (223 - 1) 540Mb/s
-
185
See Figure 6 ps p-p
2
4
-
164
Intrinsic Jitter
Pathological
(SDI checkfield)
270Mb/s
360Mb/s
540Mb/s
-
462
See Figure 7 ps p-p
2
3
-
308
-
260
Input Jitter Tolerance
270Mb/s
0.40
0.56
-
UI p-p
3
9
540Mb/s
0.35
0.43
-
Lock Time Synchronous
Switch
tSWITCH < 0.5µs, 270Mb/s
0.5µs < tSWITCH < 10ms
-
1
-
1
-
µs
4
7
-
ms
tSWITCH > 10ms
-
4
-
ms
Lock Time
Loop Bandwidth = 6MHz at 540 Mb/s
-
10
Asynchronous Switch
-
ms
5
7
SDO MUTE Time
0.5
1
2
µs
6
7
SDO to SCO
Synchronization
-200
0
200
ps
7
SDO, SCO Output Signal 75Ω DC load
Swing
600
800
1000
mV p-p
1
SDO, SCO Rise and Fall 20% - 80%
Times
200
300
400
ps
7
NOTES
1. TYPICAL - measured on EB-RD35A board, TA = 25°C.
2. Characterized 6 sigma rms.
3. IJT measured with sinusoidal modulation beyond Loop Bandwidth (at 6.5MHz).
4. Synchronous switching refers to switching the input data from one source to another source which is at the same data rate (ie: line 10
switching for component NTSC).
5. Asynchronous switching refers to switching the input data from one source to another source which is at a different data rate.
6. SDO MUTE Time refers to the response of the SDO output from valid re-clocked input data to mute mode when the input signal is removed.
TEST LEVEL
1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using correlated
test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
9. Indirect test
GENNUM CORPORATION
3 of 14
522 - 41 - 08
Share Link: 