Philips Semiconductors
2-input NAND gate
Product specification
74AHC1G00; 74AHCT1G00
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER
CONDITIONS
74AHC1G
74AHCT1G
UNIT
MIN. TYP. MAX. MIN. TYP. MAX.
VCC
VI
VO
Tamb
supply voltage
2.0 5.0 5.5 4.5 5.0 5.5 V
input voltage
0
−
5.5 0
−
5.5 V
output voltage
0
−
VCC 0
−
VCC V
operating ambient see DC and AC
−40 +25 +125 −40 +25 +125 °C
temperature
characteristics per device
tr, tf
(∆t/∆f)
input rise and fall VCC = 3.3 ±0.3 V
times
VCC = 5 ±0.5 V
−
−
100 −
−
−
ns/V
−
−
20
−
−
20
ns/V
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134); voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER
VCC
supply voltage
VI
input voltage
IIK
input diode current
IOK
output diode current
IO
output source or sink current
ICC
VCC or GND current
Tstg
storage temperature
PD
power dissipation per package
CONDITIONS
VI < −0.5 V
VO < −0.5 V or VO > VCC + 0.5 V; note 1
−0.5 V < VO < VCC + 0.5 V
for temperature range from −40 to +125 °C
MIN.
−0.5
−0.5
−
−
−
−
−65
−
MAX.
+7.0
+7.0
−20
±20
±25
±75
+150
250
UNIT
V
V
mA
mA
mA
mA
°C
mW
Note
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2002 May 27
5