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VV6501 データシートの表示(PDF) - STMicroelectronics

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VV6501
ST-Microelectronics
STMicroelectronics 
VV6501 Datasheet PDF : 60 Pages
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Defect Categorisation
Table 26: Criteria for pixel to be entered in failure map
Pixel location is a fail in map if
Small average < Large average - (1.2% of Large average)
or
Small average > Large average + (1.2% of Large average)
VV6501
The contents of the fail map determine whether the sensor fails the physical aberration test. The fail
criteria are given in Table 27 below:
Table 27: Physical aberration test fail criteria
Fail physical aberration test if
> 82 contiguousa pixel entries in the failure map
a. An example of contiguous pixels entries is given in Figure 36
Figure 36: Contiguous pixels example
The group of pixels
enclosed in the circle
are contiguous, that is
every pixel in the group
is attached to at least
one neighboring pixel.
The other pixel entries
shown in the figure
are non contiguous as
they have no touching
neighbors.
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