MX29F800BTI-90 データシートの表示（PDF） - Macronix International

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MX29F800BTI-90

8M-BIT [1Mx8/512Kx16] CMOS FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

MX29F800T/B

1.6K ohm

+5V

CL

1.2K ohm

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance

SWITCHING TEST WAVEFORMS

2.4V

0.45V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are <20ns.

COMMAND WRITE TIMING WAVEFORM

VCC

5V

Addresses VIH

VIL

WE VIH

VIL

CE VIH

VIL

OE VIH

VIL

VIH

Data

VIL

tAS

tOES

ADD Valid

tAH

tCEP

tCWC

tCS

tCH

tDS

tDH

DIN

tCEPH1

P/N:PM0578

REV. 1.7, JUL. 24, 2001

17

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