SM5009 series
5009AK× series
VDD = 4.5 to 5.5V, VSS = 0V, Ta = −40 to 85°C unless otherwise noted.
Parameter
Symbol
Condition
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
Output leakage current
Current consumption
INH pull-up resistance
Negative resistance
Feedback resistance
Built-in capacitance
VOH Q: Measurement cct 1, IOH = 16mA
VOL Q: Measurement cct 1, IOL = 16mA
VIH INH
VIL INH
Q: Measurement cct 2, INH = LOW, VOH = VDD
IZ
Q: Measurement cct 2, INH = LOW, VOL = VSS
INH = open, Measurement cct 3,
IDD
load cct 1, CL = 15pF,
40MHz crystal oscillator,
Ta = –20 to +80°C
SM5009AK1S
CF5009AK1
SM5009AK2S
CF5009AK2
RUP Measurement cct 4, VDD = 5V, INH = VSS
−RL VDD = 5V, Ta = 25°C, 40MHz
Rf Measurement cct 5
CG
Design value. A monitor pattern on a wafer is tested.
CD
Rating
Unit
min typ max
4.0
–
–
V
–
–
0.4
V
2.0
–
–
V
–
–
0.8
V
–
–
10
µA
–
–
10
–
12
26
–
12
26
mA
–
8
17
–
8
17
40
–
200 kΩ
–
–210
–
Ω
0.4
–
1.1 MΩ
5.58
6
6.42 pF
9.3
10 10.7 pF
NIPPON PRECISION CIRCUITS INC.—10