29F4000 データシートの表示（PDF） - Macronix International

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29F4000

4M-BIT [512KX8] CMOS EQUAL SECTOR FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

MX29F4000

CL

1.2K ohm

1.6K ohm

+5V

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance

CL= 50pF for 29F4000-55

SWITCHING TEST WAVEFORMS

2.4V

0.45V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are < 20ns.(5ns for 29F4000-55)

Note:VIH/VIL=3.0/0V,VOH/VOL=1.5/1.5V for 29F4000-55

COMMAND WRITE TIMING WAVEFORM

VCC

5V

Addresses VIH

VIL

WE VIH

VIL

CE VIH

VIL

OE VIH

VIL

VIH

Data

VIL

tAS

tOES

ADD Valid

tAH

tCEP

tCWC

tCS

tCH

tDS

tDH

DIN

tCEPH1

P/N:PM0629

REV. 1.0, DEC. 20, 1999

16

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