LH28F800SG-L データシートの表示（PDF） - Sharp Electronics

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LH28F800SG-L

8 M-bit (512 kB x 16) SmartVoltage Flash Memories

Sharp Electronics 

1.3 V

1N914

DEVICE

UNDER

TEST

CL Includes Jig

Capacitance

RL = 3.3 kΩ

OUT

CL

Fig. 12 Transient Equivalent Testing

Load Circuit

LH28F800SG-L/SGH-L (FOR TSOP, CSP)

Test Configuration Capacitance Loading Value

TEST CONFIGURATION

VCC = 3.3±0.3 V, 2.7 to 3.0 V

VCC = 5.0±0.25 V (NOTE 1)

VCC = 5.0±0.5 V

CL (pF)

50

30

100

NOTE :

1. Applied to high-speed products, LH28F800SG-L70 and

LH28F800SGH-L70.

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