Philips Semiconductors
Multimedia video data acquisition circuit
Objective specification
SAA5284
SYMBOL
PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
Input/output SDA (open-drain)
VIL
LOW-level input voltage
−0.5 −
VIH
HIGH-level input voltage
3.0
−
ILI
input leakage current
VI = 0 to VDD
−10 −
Ci
input capacitance
−
ti(r)
input rise time
VIL(min) to VIH(max); fi(SCL) = 100 kHz 50
−
VIL(min) to VIH(max); fi(SCL) = 400 kHz 50
−
ti(f)
input fall time
VIL(max) to VIH(min); fi(SCL) = 100 kHz 50
−
VIL(max) to VIH(min); fi(SCL) = 400 kHz 50
−
VOL
LOW-level output voltage IOL = 3 mA
0
−
IOL = 6 mA
0
−
to(f)
output fall time
between 3 and 1.5 V; IOL = 3 mA 50
−
CL
load capacitance
−
−
Input/output BLACK
CBLACK storage capacitance to VSSA
−
100
Inputs/outputs D7 to D0
VIL
LOW-level input voltage
VIH
HIGH-level input voltage
ILI
input leakage current
VIN = 0 to VDD
Ci
input capacitance
VOL
LOW-level output voltage IOL = +1.6 mA
VOH
HIGH-level output voltage IOH = −0.2 mA
CL
load capacitance
to(r)
output rise time into CL
0.6 to 2.2 V
to(f)
output fall time into CL
2.2 to 0.6 V
−0.3 −
2.0
−
−10 −
−
−
0
−
2.4
−
−
−
−
−
−
−
Outputs INT, DENB and DMARQ
VOL
LOW-level output voltage IOL = +1.6 mA
VOH
HIGH-level output voltage IOH = −0.2 mA
CL
load capacitance
to(r)
output rise time into CL
0.6 to 2.2 V
to(f)
output fall time into CL
2.2 to 0.6 V
0
−
2.4
−
−
−
−
−
−
−
RDY (open-drain); note 1
VOL
LOW-level output voltage IOL = +1.6 mA
CL
load capacitance
to(r)
output rise time into CL
0.6 to 2.2 V
to(f)
output fall time into CL
2.2 to 0.6 V
0
−
−
−
−
−
−
−
+1.5
V
VDD + 0.5 V
+10
µA
10
pF
1 000
ns
300
ns
300
ns
300
ns
0.4
V
0.6
V
250
ns
400
pF
−
nF
+0.8
V
VDD + 0.5 V
+10
µA
10
pF
0.4
V
VDD
V
tbf
pF
tbf
ns
tbf
ns
0.4
V
VDD
V
tbf
pF
tbf
ns
tbf
ns
0.4
V
tbf
pF
tbf
ns
tbf
ns
1998 Feb 05
10