2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
GENERAL DESCRIPTION
The MT28C3214P2FL and MT28C3214P2NFL com-
bination Flash and SRAM memory devices provide a
compact, low-power solution for systems where PCB
real estate is at a premium. The dual-bank Flash is a
high-performance, high-density, nonvolatile memory
device with a revolutionary architecture that can sig-
nificantly improve system performance.
This new architecture features:
• A two-memory-bank configuration supporting
dual-bank burst operation;
• A high-performance bus interface providing a fast
page data transfer; and
• A conventional asynchronous bus interface.
The device also provides soft protection for blocks
by configuring soft protection registers with dedicated
command sequences. For security purposes, dual 64-
bit chip protection registers are provided.
The embedded WORD WRITE and BLOCK ERASE
functions are fully automated by an on-chip write state
machine (WSM). The WSM simplifies these operations
and relieves the system processor of secondary tasks.
An on-chip status register, one for each bank, can be
used to monitor the WSM status to determine the
progress of a PROGRAM/ERASE command.
The erase/program suspend functionality allows
compatibility with existing EEPROM emulation soft-
ware packages.
The device takes advantage of a dedicated power
source for the Flash device (F_VCC) and a dedicated
power source for the SRAM device (S_VCC), both at
1.65V–1.95V or 1.80V–2.20V for optimized power con-
sumption and improved noise immunity. The
MT28C3214P2FL and MT28C3214P2NFL devices sup-
port two VPP voltage ranges, VPP1 and VPP2. VPP1 is an
in-circuit voltage of 0.9V–2.2V (MT28C3214P2FL) or
0.0V–2.2V (MT28C3214P2NFL). VPP2 is the production
compatibility voltage of 12V ±5%. The 12V ±5% VPP2 is
supported for a maximum of 100 cycles and 10 cumula-
tive hours. See Table 1.
The MT28C3214P2FL and MT28C3214P2NFL de-
vices contain an asynchronous 4Mb SRAM organized
as 256K-words by 16 bits. These devices are fabricated
using an advanced CMOS process and high-speed/
ultra-low-power circuit technology.
The MT28C3214P2FL and MT28C3214P2NFL de-
vices are packaged in a 66-ball FBGA package with
0.80mm pitch.
DEVICE MARKING
Due to the size of the package, Micron’s standard
part number is not printed on the top of each device.
Instead, an abbreviated device mark comprised of a
five-digit alphanumeric code is used. The abbreviated
device marks are cross referenced to Micron part num-
bers in Table 2.
ARCHITECTURE AND MEMORY
ORGANIZATION
The Flash memory device contains two separate
memory banks (bank a and bank b) for simultaneous
READ and WRITE operations. Bank a is 4Mb deep and
contains 8 x 4K-word parameter blocks and seven 32K-
word blocks. Bank b is 28Mb deep, is equally sectored,
and contains fifty-six 32K-word blocks.
Figures 2 and 3 show the top and bottom memory
organizations.
Table 1
VPP Voltage Ranges
DEVICE
MT28C3214P2FL
MT28C3214P2NFL
VOLTAGE RANGE
VPP1
VPP2
0.9V–2.2V 11.4V–12.6V
0.0V–2.2V 11.4V–12.6V
Table 2
Cross Reference for Abbreviated Device Marks
PART NUMBER
MT28C3214P2FL-10 BET
MT28C3214P2FL-10 TET
MT28C3214P2FL-11 BET
MT28C3214P2FL-11 TET
MT28C3214P2NFL-11 TET
PRODUCT
MARKING
FW420
FW421
FW437
FW431
FW439
SAMPLE
MARKING
FX420
FX421
FX437
FX431
FX439
MECHANICAL
SAMPLE MARKING
FY420
FY421
FY437
FY431
FY439
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory
MT28C3214P2FL_4.p65 – Rev. 4, Pub. 4/02
2
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.