Philips Semiconductors
2-input NAND gate
Product specification
74HC1G00; 74HCT1G00
AC CHARACTERISTICS
Type 74HC1G00
GND = 0 V; tr = tf ≤ 6.0 ns; CL = 50 pF.
TEST CONDITIONS
Tamb (°C)
SYMBOL PARAMETER
WAVEFORMS
−40 to +85
VCC (V) MIN. TYP.(1) MAX.
−40 to +125
MIN. MAX.
UNIT
tPHL/tPLH propagation delay see Figs 5 and 6 2.0
−
A and B to Y
4.5
−
6.0
−
25
115 −
9
23
−
8
20
−
135 ns
27
ns
23
ns
Note
1. All typical values are measured at Tamb = 25 °C.
Type 74HCT1G00
GND = 0 V; tr = tf ≤ 6.0 ns; CL = 50 pF.
TEST CONDITIONS
Tamb (°C)
SYMBOL PARAMETER
WAVEFORMS
VCC (V)
−40 to +85
MIN. TYP.(1) MAX.
−40 to +125
MIN. MAX.
UNIT
tPHL/tPLH propagation delay see Figs 5 and 6 4.5
−
A and B to Y
12
24
−
27
ns
Note
1. All typical values are measured at Tamb = 25 °C.
2002 May 15
7