Philips Semiconductors
8-input NAND gate
Product specification
74AHC30; 74AHCT30
AC CHARACTERISTICS
Type 74AHC30
GND = 0 V; tr = tf ≤ 3.0 ns.
SYMBOL PARAMETER
TEST CONDITIONS
WAVEFORMS CL
Tamb (°C)
25
−40 to +85 −40 to +125 UNIT
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
VCC = 3.0 to 3.6 V; note 1
tPHL/tPLH
propagation delay see Figs 5 and 6 15 pF −
A, B, C, D, E, F, G,
H to Y
50 pF −
5.0 9.5 1.0 11.0 1.0 12.0 ns
6.7 12.0 1.0 14.5 1.0 15.5 ns
VCC = 4.5 to 5.5 V; note 2
tPHL/tPLH
propagation delay see Figs 5 and 6 15 pF −
A, B, C, D, E, F, G,
H to Y
50 pF −
3.6 6.5 1.0 7.5 1.0 8.0 ns
4.9 8.0 1.0 9.5 1.0 10.5 ns
Notes
1. Typical values at VCC = 3.3 V.
2. Typical values at VCC = 5.0 V.
Type 74AHCT30
GND = 0 V; tr = tf ≤ 3.0 ns.
SYMBOL PARAMETER
TEST CONDITIONS
WAVEFORMS CL
Tamb (°C)
25
−40 to +85 −40 to +125 UNIT
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
VCC = 4.5 to 5.5 V; note 1
tPHL/tPLH
propagation delay see Figs 5 and 6 15 pF −
A, B, C, D, E, F, G,
H to Y
50 pF −
3.3 6.5
4.7 8.5
1.0 7.5
1.0 9.5
1.0 8.0 ns
1.0 10.5 ns
Note
1. Typical values at VCC = 5.0 V.
1999 Nov 30
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