NXP Semiconductors
8. Test information
BSS84AK
50 V, 180 mA P-channel Trench MOSFET
P
t2
duty cycle δ =
t1
t2
t1
Fig 17. Duty cycle definition
t
006aaa812
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
BSS84AK
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 23 May 2011
© NXP B.V. 2011. All rights reserved.
10 of 16