CY7C1486BV25-250BGXI データシートの表示（PDF） - Cypress Semiconductor

部品番号

コンポーネント説明

メーカー

CY7C1486BV25-250BGXI

72-Mbit (2M x 36/4M x 18/1M x 72) Pipelined Sync SRAM

Cypress Semiconductor 

CY7C1480BV25

CY7C1482BV25, CY7C1486BV25

Capacitance

Tested initially and after any design or process change that may affect these parameters.

Parameter

CADDRESS

CDATA

CCTRL

CCLK

CIO

Description

Address Input Capacitance

Data Input Capacitance

Control Input Capacitance

Clock Input Capacitance

Input/Output Capacitance

Test Conditions

TA = 25°C, f = 1 MHz,

VDD = 2.5V

VDDQ = 2.5V

100 TQFP 165 FBGA 209 FBGA

Package Package Package

Unit

6

6

6

pF

5

5

5

pF

8

8

8

pF

6

6

6

pF

5

5

5

pF

Thermal Resistance

Tested initially and after any design or process change that may affect these parameters.

Parameter

ΘJA

ΘJC

Description

Thermal Resistance

(Junction to Ambient)

Thermal Resistance

(Junction to Case)

Test Conditions

Test conditions follow

standard test methods and

procedures for measuring

thermal impedance, per

EIA/JESD51.

100 TQFP

Max

24.63

2.28

165 FBGA

Max

16.3

2.1

209 FBGA

Max

15.2

1.7

Unit

°C/W

°C/W

AC Test Loads and Waveforms

2.5V IO Test Load

OUTPUT

Z0 = 50Ω

2.5V

OUTPUT

RL = 50Ω

5 pF

VL = 1.25V

(a)

INCLUDING

JIG AND

SCOPE

R = 1667Ω

R = 1583Ω

(b)

VDDQ

GND

ALL INPUT PULSES

10%

90%

≤ 1 ns

90%

10%

≤ 1 ns

(c)

Document #: 001-15143 Rev. *D

Page 20 of 31

[+] Feedback

Share Link: