WS57LV291C データシートの表示（PDF） - STMicroelectronics
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WS57LV291C Datasheet PDF : 6 Pages
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AC READ TIMING DIAGRAM
ADDRESSES
CS
OUTPUTS
VALID
tACC
tOH
tCS
VALID
tDF
WS57LV291C
CAPACITANCE(4) TA = 25°C, f = 1 MHz
SYMBOL
PARAMETER
CONDITIONS
CIN
COUT
CVPP
Input Capacitance
Output Capacitance
VPP Capacitance
VIN = 0V
VOUT = 0V
VPP = 0 V
NOTES: 4. This parameter is only sampled and is not 100% tested.
5. Typical values are for TA = 25°C and nominal supply voltages.
TYP (5)
4
8
18
MAX
6
12
25
UNITS
pF
pF
pF
TEST LOAD (High Impedance Test Systems)
A.C. TESTING INPUT/OUTPUT WAVEFORM
1.80 V
D.U.T.
98 Ω
30 pF
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
3.0
1.5
TEST
1.5
POINTS
0.0
A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V for a
logic "0." Timing measurements are made at 1.5 V for input and
output transitions in both directions.
NOTE: 6. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between VCC and ground is recommended.
Inadequate decoupling may result in access time degradation or other transient performance failures.
2-17
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