TAA 762
TAA 765
C1 for min. overshoot (approx. 22 pF)
Test Circuit 1 for Slew Rate (non-inverting operation)
C2 causes a frequency-dependent compensation to reduce rise times (approx. 390 pF)
C1 for min. overshoot (approx. 3.9 pF)
Test Circuit 2 for Slew Rate (inverting operation)
Semiconductor Group
9