NL37WZ14
MAXIMUM RATINGS
Symbol
Characteristics
Value
Unit
VCC
VIN
IIK
IOK
IOUT
ICC or IGND
TSTG
TL
TJ
qJA
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Active−Mode (High or Low State)
Tri−State Mode (Note 1)
Power−Down Mode (VCC = 0 V)
DC Input Diode Current
DC Output Diode Current
DC Output Source/Sink Current
VIN < GND
VOUT < GND
DC Supply Current per Supply Pin or Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 secs
Junction Temperature Under Bias
Thermal Resistance (Note 2)
US8
UQFN8
UDFN
−0.5 to +6.5
−0.5 to +6.5
−0.5 to VCC + 0.5
−0.5 to +6.5
−0.5 to +6.5
−50
−50
±50
±100
−65 to +150
260
+150
250
210
231
V
V
V
mA
mA
mA
mA
°C
°C
°C
°C/W
PD
Power Dissipation in Still Air
US8
500
mW
UQFN8
595
UDFN8
541
MSL
Moisture Sensitivity
Level 1
−
FR
VESD
Flammability Rating
ESD Withstand Voltage (Note 3)
Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
−
Human Body Model
2000
V
Charged Device Model
1000
ILatchup Latchup Performance (Note 4)
$100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Applicable to devices with outputs that may be tri−stated.
2. Measured with minimum pad spacing on an FR4 board, using 10mm−by−1inch, 2 ounce copper trace no air flow per JESD51−7.
3. HBM tested to ANSI/ESDA/JEDEC JS−001−2017. CDM tested to EIA/JESD22−C101−F. JEDEC recommends that ESD qualification to
EIA/JESD22−A115−A (Machine Model) be discontinued per JEDEC/JEP172A.
4. Tested to EIA/JESD78 Class II.
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min
Max
Unit
VCC
Positive DC Supply Voltage
1.65
5.5
V
VIN
DC Input Voltage
0
5.5
V
VOUT
DC Output Voltage
Active−Mode (High or Low State)
0
VCC
Tri−State Mode (Note 1)
0
5.5
Power−Down Mode (VCC = 0 V)
0
5.5
TA
Operating Temperature Range
−55
+125
°C
tr , tf
Input Rise and Fall Time
VCC = 1.65 V to 1.95 V
0
VCC = 2.3 V to 2.7 V
0
VCC = 3.0 V to 3.6 V
0
VCC = 4.5 V to 5.5 V
0
No Limit
No Limit
No Limit
No Limit
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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