
LOGIC DIAGRAM
PRE
CLK
J
K
CLR
OPERATIONAL ENVIRONMENT1
PARAMETER
Total Dose
SEU Threshold 2
SEL Threshold
Neutron Fluence
LIMIT
1.0E6
80
120
1.0E14
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
Q
Q
UNITS
rads(Si)
MeV-cm2/mg
MeV-cm2/mg
n/cm2
2