74AHCT1G07GW,165 Ver la hoja de datos (PDF) - NXP Semiconductors.

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fabricante

74AHCT1G07GW,165

Buffer with open-drain output

NXP Semiconductors. 

NXP Semiconductors

12. Waveforms

74AHC1G07; 74AHCT1G07

Buffer with open-drain output

$LQSXW

9,

*1'

<RXWSXW

9&&

92/

90

W 3/=

92/9

Measurement points are given in Table 9.

Fig 5. Input (A) to output (Y) propagation delays

W 3=/

90

PQD

Table 9. Measurement point

Type

Input

74AHC1G07

74AHCT1G07

VI

GND to VCC

GND to 3.0 V

VM(1)

0.5  VCC

1.5 V

Output

VM(2)

0.5  VCC

0.5  VCC

9,

38/6(

*(1(5$725

9&&

92

'87

57

6

5/ 

ȍ

&/

PQD

9&&

RSHQ

*1'

Fig 6.

Test data is given in Table 8. Definitions for test circuit:

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

For tPLZ, tPZL, S1 = VCC

Test circuit for measuring switching times

74AHC_AHCT1G07

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 7 — 18 November 2014

© NXP Semiconductors N.V. 2014. All rights reserved.

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