FQA22P10 Ver la hoja de datos (PDF) - Fairchild Semiconductor
Número de pieza
componentes Descripción
fabricante
FQA22P10 Datasheet PDF : 8 Pages
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Gate Charge Test Circuit & Waveform
Same Type
VGS
50KΩ
as DUT
Qg
12V
200nF
300nF
-10V
VGS
VDS
Qgs
Qgd
DUT
-3mA
Charge
Resistive Switching Test Circuit & Waveforms
-10V
VDS
VGS
RG
RL
VDD
DUT
td(on)
VGS 10%
t on
tr
VDS
90%
t off
td(off)
tf
Unclamped Inductive Switching Test Circuit & Waveforms
L
VDS
EAS
=
--1--
2
L IAS2
BVDSS
--------------------
BVDSS - VDD
tp
Time
ID
RG
VDD
VDD
ID (t)
VDS (t)
-10V
tp
DUT
IAS
BVDSS
©2002 Fairchild Semiconductor Corporation
Rev. C2, August 2002
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