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MC33880 Ver la hoja de datos (PDF) - Freescale Semiconductor

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fabricante
MC33880 Datasheet PDF : 25 Pages
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TIMING DIAGRAMS
CS
0.2 VDD
tLEAD
SCLK
0.7 VDD
0.2 VDD
tDI(SU) tDI(HOLD)
DI
0.7 VDD
0.2 VDD
MSB in
DO
tDO(EN)
0.7 VDD
0.2 VDD
MSB out
tVALID
Figure 5. SPI Timing Diagram
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
tLAG
tDO(DIS)
LSB out
SCLK
VDD = 5.0 V
33880
Under
Test
DO
CL = 200 pF
NOTE: CL represents the total capacitance of the test
fixture and probe.
Figure 6. Valid Data Delay Time
and Valid Time Test Circuit
VDD = 5.0 V
VPull-Up = 2.5 V
33880
CS
Under
Test
RL = 1.0 kΩ
DO
CL = 200 pF
VDD = 5.0 V
VPWR = 13 V
33880
CS
Under
Test
RL = 620 Ω
Output
CL
NOTE: CL represents the total capacitance of the test
fixture and probe.
Figure 8. Switching Time Test Circuit
NOTE: CL represents the total capacitance of the test
fixture and probe.
Figure 7. Enable and Disable Time Test Circuit
Analog Integrated Circuit Device Data
Freescale Semiconductor
33880
9

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