SVF8N60T Ver la hoja de datos (PDF) - Silan Microelectronics
Número de pieza
componentes Descripción
fabricante
SVF8N60T Datasheet PDF : 8 Pages
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SVF8N60T/F_Datasheet
TYPICAL TEST CIRCUIT
Gate Charge Test Circuit & Waveform
Same Type
VGS
Qg
50KΩ
as DUT
10V
VDS
12V
200nF
300nF
Qgs
Qgd
VGS
DUT
3mA
Charge
10V
VDS
VGS
RG
Resistive Switching Test Circuit & Waveform
RL
VDD
DUT
VDS
90%
10%
VGS
tr td(on)
ton
td(off)
tf
toff
RG
10V
tp
Unclamped Inductive Switching Test Circuit & Waveform
L
VDS
ID
BVDSS
IAS
EAS =
1
2
LIAS2
BVDSS
BVDSS - VDD
DUT
VDD
VDD
ID(t)
tp
VDS(t)
Time
HANGZHOU SILAN MICROELECTRONICS CO.,LTD
Http://www.silan.com.cn
REV:1.3
2012.06.15
Page 6 of 8
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