HCF4093 Ver la hoja de datos (PDF) - STMicroelectronics

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HCF4093

QUAD 2-input NAND Schmidt trigger

STMicroelectronics 

HCF4093

Electrical characteristics

3.1

Dynamic electrical characteristics

)

Table 7.

Symbol

Dynamic electrical characteristics (Tamb = 25°C, CL = 50 pF, RL = 200 KΩ,

tr = tf = 20 ns)

Parameter

Test

Condition

Value (*)

Unit

VDD

Min Typ Max

(V)

5

tPLH tPHL

Propagation delay time

10

15

5

190 380

90

180

ns

65

130

100 200

tTLH tTHL

Output transition time

10

15

50

100

ns

40

80

(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.

Figure 3. Test circuit

1. CL = 50 pF or equivalent (includes jig and probe capacitance)

2. RL = 200 KΩ

3. RT = ZOUT of pulse generator (typically 50 Ω)

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