Electrical Characteristics Measurement Circuit
VI_T
II_T Device under test
A
TTL_IN
TTL_OUT
IO_T V VO_T
(a) TTL I/O DC characteristics measurement circuit
CXB1586AR
Pulse
generator
Device under test
TTL_IN
TTL_OUT
Probe
CL
Oscilloscope
CL=10pF (including the probe capacitance)
(b) TTL I/O AC characteristics measurement circuit
VI_TE
II_E Device under test
A
ECL_IN
ECL_OUT
50Ω
V VO_E
VCCE–2V
(c) ECL I/O DC characteristics measurement circuit
Pulse
generator
50Ω Transmission line
VCCE–2V
50Ω
Device under test
0.1µF
ECL_IN
ECL_OUT
ECL_IN∗
ECL_OUT∗
50Ω 0.1µF
VCCE–2V
VCCE–2V
50Ω
Oscilloscope
50Ω
VCCE–2V
CL≤2pF (input capacitance of the measurement equipment
and floating capacitance)
(d) ECL I/O AC characteristics measurement circuit
—13—