ATF20V8B-15SC Ver la hoja de datos (PDF) - Atmel Corporation

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ATF20V8B-15SC

High-performance EE PLD

Atmel Corporation 

ATF20V8B(Q)(L)

DC Characteristics

Symbol Parameter

Condition

Min

Typ

Max

IIL

Input or I/O Low

Leakage Current

0 ≤ VIN ≤ VIL(Max)

-35

-100

IIH

Input or I/O High

Leakage Current

3.5 ≤ VIN ≤ VCC

10

B-7, -10

Com.

Ind.

60

90

60

100

B-15

Com.

60

80

B-15

Ind.

60

90

B-25

Com.

ICC

Power Supply

Current, Standby

VCC = Max,

VIN = Max,

Outputs Open

B-25

Ind.

BQ-10

Com.

60

80

60

90

35

55

BQL-15

Com.

5

10

BQL-15

Ind.

5

15

BQL-25

Com.

5

10

BQL-25

Ind.

5

15

B-7, -10

Com.

Ind.

80

110

80

125

B-15

Com.

60

90

B-15

Ind.

60

105

ICC2

Clocked Power

Supply Current

VCC = Max,

Outputs Open,

f = 15 MHz

B-25

B-25

BQ-10

Com.

Ind.

Com.

60

90

60

105

40

55

BQL-15

Com.

20

35

BQL-15

Ind.

20

40

BQL-25

Com.

20

35

BQL-25

Ind.

20

40

IOS(1)

Output Short

Circuit Current

VOUT = 0.5V

-130

VIL

VIH

VOL

VOH

Notes:

Input Low Voltage

-0.5

0.8

Input High Voltage

2.0

VCC + 0.75

Output Low Voltage

VIN = VIH or VIL,

VCC = Min

IOL = 24 mA

IOL = 16 mA

Com.,

Ind.

0.5

0.5

Output High Voltage

VIN = VIH or VIL,

VCC = Min

IOH = -4.0 mA

2.4

1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.

2. Shaded parts are obsolete with a last time buy date of 19 August 1999.

Units

µA

µA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

V

V

V

V

V

3

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